Auger emission from Xe above and below the 4d ionization threshold
- 14 December 1993
- journal article
- Published by IOP Publishing in Journal of Physics B: Atomic, Molecular and Optical Physics
- Vol. 26 (23) , 4425-4435
- https://doi.org/10.1088/0953-4075/26/23/014
Abstract
The Auger electron yield from xenon has been measured in the vicinity of the 4d inner-shell ionization threshold. Just above this ionization threshold the Auger line profile is modified by the post-collision interaction effect involving a slow photoelectron. The process is followed through threshold into a region where the photoelectron is recaptured and either shaken up/down or remains in its Rydberg orbital during the Auger decay. By measuring the electron yield as a function of both incident photon energy and electron kinetic energy a comprehensive study of these processes is made.Keywords
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