Electron Scattering in Perovskite-Oxide Ferroelectric Semiconductors
- 10 April 1969
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 180 (2) , 547-556
- https://doi.org/10.1103/physrev.180.547
Abstract
This paper reports new data on the hydrostatic-pressure dependence of the conductivity and static dielectric constant, as well as new Hall-effect data taken over a wide temperature range, in the perovskite-oxide ferroelectrics KTa, SrTi, BaTi, and (). From the linear dependence of the electron mobility and the reciprocal dielectric constant on pressure in all materials studied, we conclude that . Based on the observed temperature dependence of the Hall mobility and the Curie-Weiss behavior of , we conclude further that in the perovskite oxides the temperature dependence of the mobility is given by the empirical expression , , where is an experimental constant and is the Curie-Weiss temperature (K and K for KTa, K and K for SrTi, K and K for K , and K and K for BaTi). Our experimental results are shown to be inconsistent with previously reported suggestions that the electron mobility in the perovskite oxides is dominated by LO-mode scattering. We suggest, instead, that the electron mobility is determined by a new and strong electron-phonon interaction involving critical-point lattice-polarization fluctuations associated with the soft TO mode.
Keywords
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