Measurement of the bending elastic modulus of a flat monolayer at a liquid interface
- 1 December 1990
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 2 (S) , SA347-SA352
- https://doi.org/10.1088/0953-8984/2/s/054
Abstract
The bending elastic modulus of monolayers is deduced from the study of their thermal fluctuations on a low scale (about 100 AA) by optical techniques: X-ray reflectivity measurements and ellipsometry. The author explains why ellipsometry is more sensitive than reflectivity at small scales.Keywords
This publication has 14 references indexed in Scilit:
- Capillary Waves and Bending Elasticity of Monolayers on Water Studied by X-Ray Reflectivity as a Function of Surface PressureEurophysics Letters, 1989
- Liquid interfaces : role of the fluctuations and analysis of ellipsometry and reflectivity measurementsJournal de Physique, 1987
- Effects of Thermal Fluctuations on Systems with Small Surface TensionPhysical Review Letters, 1985
- Effect of thermal undulations on the rigidity of fluid membranes and interfacesJournal de Physique, 1985
- Measurement of the rigidity coefficient of a surfactant layer and structure of the oil or water microemulsion interfaceJournal de Physique Lettres, 1985
- LIGHT SCATTERING AND REFLECTIVITY OF LIQUID INTERFACESLe Journal de Physique Colloques, 1983
- Optical reflectivity of a diffuse interfaceJournal de Physique Lettres, 1982
- Electric and magnetic susceptibilities for a fluid-fluid interface; The ellipsometric coefficientPhysica A: Statistical Mechanics and its Applications, 1981
- On the influence of thin films and surface roughness on the reflection, transmission and scattering of lightJournal of Optics, 1977
- II Scattering of Light by Rough SurfacesPublished by Elsevier ,1967