Cumulative disorder and x-ray line broadening in multilayers
- 15 October 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (8) , 5955-5958
- https://doi.org/10.1103/physrevb.34.5955
Abstract
We have measured the high-angle x-ray diffraction from crystalline Pb-amorphous Ge multilayers. The experimental data in conjunction with a model calculation for the fluctuation in amorphous-layer thickness show tha this fluctuation is larger than about 5%. A smaller thickness variation implies the existence of high-angle peaks which have not been observed in any amorphous-crystalline multilayers.Keywords
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