Fundamentals and Special Applications of Non-Contact Scanning Force Microscopy
- 1 January 1993
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 87 references indexed in Scilit:
- Work-function anisotropies as an origin of long-range surface forcesPhysical Review Letters, 1992
- Structure of hard spheres in contact with a spherical wallPhysical Review B, 1991
- Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivityJournal of Applied Physics, 1991
- Magnetic domain walls in thick iron filmsPhysical Review B, 1991
- An atomic-resolution atomic-force microscope implemented using an optical leverJournal of Applied Physics, 1989
- Imaging of tip‐sample compliance in STMJournal of Microscopy, 1988
- Atomic resolution with the atomic force microscope on conductors and nonconductorsJournal of Vacuum Science & Technology A, 1988
- Atomic Force MicroscopePhysical Review Letters, 1986
- Simple model for the vortex core in a type II superconductorJournal of Low Temperature Physics, 1975
- The Influence of Retardation on the London-van der Waals ForcesPhysical Review B, 1948