Direct, simultaneous determination of XPS background and inelastic differential cross section using Tougaard's algorithm
- 31 December 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 320 (1-2) , 191-200
- https://doi.org/10.1016/0039-6028(94)91270-x
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
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