VAMAS surface chemical analysis technical working party—an overview of project objectives, progress and the requirements for further work
- 1 July 1990
- journal article
- data interpretation-and-quantification
- Published by Wiley in Surface and Interface Analysis
- Vol. 16 (1-12) , 135-139
- https://doi.org/10.1002/sia.740160126
Abstract
An update for 1989 is given for the VAMAS Surface Chemical Analysis Technical Working Party. The overall programme now has 26 projects targeted to solve key problems in the enabling base of AES, XPS, SIMS, SNMS and sputter depth profiling. Increased coordination of projects is leading to stronger project databases. Eleven of the projects have involved round robins, and details are provided of results where the analysis is complete and of project leaders where new participants are invited.Keywords
This publication has 4 references indexed in Scilit:
- Post‐1989 calibration energies for X‐ray photoelectron spectrometers and the 1990 Josephson constantSurface and Interface Analysis, 1989
- VAMAS surface chemical analysis technical working party: An update for 1988Surface and Interface Analysis, 1989
- VAMAS Surface chemical analysis standard data transfer format with skeleton decoding programsSurface and Interface Analysis, 1988
- Round robin study of impurity analysis in gallium arsenide using secondary ion mass spectrometryAnalytical Chemistry, 1985