Point-contact electron tunneling spectrometer
- 1 July 1982
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 53 (7) , 997-1000
- https://doi.org/10.1063/1.1137122
Abstract
In this paper we present the description of a point contact spectrometer which allows us to realize tunnel junctions (sample/Al oxide/Al) by mechanically approaching the sample (mounted as a moving electrode) to an oxidized Al counterelectrode. Due to the design, the careful choice of materials, and the use of a very accurate driving system (with an approach detecting feedback) this spectrometer is extremely efficient over a wide temperature range. The particular geometry makes possible the study of tunnel characteristics on single crystals of compounds that do not stand vacuum evaporation, usually involved in standard thin-film tunnel technique.Keywords
This publication has 3 references indexed in Scilit:
- Elastic electron tunneling study of the metal-insulator transition in TTF-TCNQSolid State Communications, 1981
- Digital inelastic electron tunneling spectrometerReview of Scientific Instruments, 1981
- Influence of a mechanical modulation on electrical transport in point-contact junctionsJournal of Applied Physics, 1979