Potentiostatic testing of plasma-deposited silicon nitride thin protective films for bonds, bondwires and bondpads in microelectronic assemblies
- 1 March 1992
- journal article
- Published by Elsevier in Corrosion Science
- Vol. 33 (3) , 403-412
- https://doi.org/10.1016/0010-938x(92)90069-f
Abstract
No abstract availableKeywords
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