Determination of energy barrier for structural relaxation in a-Si and a-Ge by Raman scattering
- 1 July 1984
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 66 (1-2) , 109-114
- https://doi.org/10.1016/0022-3093(84)90307-7
Abstract
No abstract availableKeywords
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