Optimized Gated Detection for Lifetime Measurement over a Wide Range of Single Exponential Decays

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Abstract
Optimal estimation parameters are determined for the rapid lifetime determination technique (RLD) of fitting an exponential model to luminescence decay data that exhibit a wide range of lifetimes. Optimization of the lifetime estimate by this technique depends on only two parameters—period of integration and separation between the periods of integration. Luminescence quenching experiments produce a range of decay lifetimes. Selection of a fixed set of measuring parameters to determine lifetime throughout the entire range can simplify instrumentation and result in enhanced computation speed. The measuring parameters must be optimized to yield the best estimation of each lifetime in the range. The errors in measured lifetime for the RLD technique are investigated for a wide range of luminescence decays. Optimal separation and periods of integration for the modified RLD technique are found by modeling a set of simulated decay data with different lifetimes. Results from the simulation are then compared to similar measurements of oxygen-quenched luminescence decay. Agreement between simulation and quenching data is good.