HIGH-SENSITIVITY ELECTRON SPECTROMETER
- 1 May 1970
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 16 (9) , 348-351
- https://doi.org/10.1063/1.1653221
Abstract
A new type of retarding potential difference electron spectrometer using spherical grids is described. The unique feature of the analyzer is a post monochromator section which selectively collects electrons passing the retarding grids with minimum kinetic energy. Factors affecting the resolution of the analyzer are discussed and a comparison with several other spectrometers operating in the resolution range of 0.05% is presented. An application to x‐ray photoelectron spectroscopy is presented.Keywords
This publication has 7 references indexed in Scilit:
- Resolution and Sensitivity Considerations of an Auger Electron Spectrometer Based on Display LEED OpticsReview of Scientific Instruments, 1969
- ENHANCEMENT OF SENSITIVITY IN ESCA SPECTROMETERSApplied Physics Letters, 1968
- OPTIMIZATION OF AUGER ELECTRON SPECTROSCOPY IN LEED SYSTEMSApplied Physics Letters, 1968
- Use of LEED Apparatus for the Detection and Identification of Surface ContaminantsJournal of Applied Physics, 1967
- Photoelectron Spectroscopy with a Spherical Analyzer. The Vibrational Energy Levels ofPhysical Review Letters, 1965
- High Resolution, Low Energy Electron SpectrometerReview of Scientific Instruments, 1964
- The Focusing of Charged Particles by a Spherical CondenserPhysical Review B, 1938