Effect of noise and capacitance on the dynamical characteristics of high-T c Josephson junctions

20 September 1993

journal article
Published by AIP Publishing in Applied Physics Letters

Vol. 63 (12) , 1687-1689
https://doi.org/10.1063/1.110685

Abstract

The dynamical characteristics of Josephson junctions at finite temperatures are simulated in the resistively shunted junction model including a capacitance and a current source producing white noise. It is shown how the height and the shape of the Shapiro steps as a function of the microwave amplitude are affected by noise as well as by the capacitance. The results of the simulations are found to be in good agreement with recently published experimental data on different types of Josephson weak links fabricated from high‐T c materials.

Keywords

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