Microwave response of -Ag-Al-Pb superconducting proximity junctions
- 1 June 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 41 (16) , 11627-11629
- https://doi.org/10.1103/physrevb.41.11627
Abstract
Thin-film -Ag-Al-Pb proximity structures have been fabricated. The current-voltage characteristics are typically those of a superconductor-normal metal-superconductor (S-N-S) junction. Sharp Shapiro steps appear in a microwave field. The dependence of step height on microwave power can be interpreted in terms of the resistively shunted junction (RSJ) model, with a critical current ∝sinφ, where φ is the phase difference of the superconducting order parameter across the junction. It is the first time that this behavior is demonstrated for a S-N-S junction composed of both a classical and an oxide superconducting electrode.
Keywords
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