Coupled noise predictors for lossy interconnects
- 1 January 1994
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B
- Vol. 17 (4) , 520-524
- https://doi.org/10.1109/96.338717
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Noise containment in a high wiring density multichip modulePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Computation of transients in lossy VLSI packaging interconnectionsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1990
- Coupled Lossy Transmission Line Characterization and SimulationIBM Journal of Research and Development, 1981
- Time-domain analysis of multiple parallel transmission lines by means of equivalent circuitsElectronics Letters, 1967