Computation of transients in lossy VLSI packaging interconnections
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 13 (4) , 833-838
- https://doi.org/10.1109/33.62527
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Simulation of transients in VLSI packaging interconnectionsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1990
- Transmission line simulator as a basic component of CAD system for VLSI interconnectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1990
- Scattering parameter transient analysis of transmission lines loaded with nonlinear terminationsIEEE Transactions on Microwave Theory and Techniques, 1988
- Analysis of Time Response of Lossy Multiconductor Transmission Line NetworksIEEE Transactions on Microwave Theory and Techniques, 1987
- Introduction of Frequency-Dependent Line Parameters into an Electromagnetic Transients ProgramIEEE Transactions on Power Apparatus and Systems, 1970