The effects of bias voltage and annealing on the microstructure and residual stress of arc-evaporated Cr–N coatings
- 1 November 1999
- journal article
- conference paper
- Published by Elsevier in Surface and Coatings Technology
- Vol. 120-121, 272-276
- https://doi.org/10.1016/s0257-8972(99)00383-7
Abstract
No abstract availableKeywords
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