Improved extraction of base and emitter resistance from small signal high frequency admittance measurements

Publisher Website

20 January 2003

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 93-96
https://doi.org/10.1109/bipol.1999.803534

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Measuring the base resistance of bipolar transistors
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002