Electronic structure of the 'fast donor' in high-purity germanium
- 20 March 1980
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 13 (8) , L141-L146
- https://doi.org/10.1088/0022-3719/13/8/001
Abstract
A model calculation is proposed for the ground state of the 'fast donor' defect in germanium. The model is based on the assumption of a molecular complex oriented along the different threefold crystal axes. The unusual behaviour of the donor excitation spectrum under uniaxial stress along a (111) direction is explained by this model, if a reorientation at low stress values of the defects oriented parallel to the applied stress is assumed. The value Xi u=19.8+or-1.0 eV is obtained for the shear-deformation potential, in excellent agreement with other determinations.Keywords
This publication has 9 references indexed in Scilit:
- Carrier Trapping in High-Purity GermaniumIEEE Transactions on Nuclear Science, 1979
- Lithium-Oxygen Donor in Germanium: A Dynamic Tunneling SystemPhysical Review Letters, 1978
- A New Method to Determine the Chemical Composition and Structure of Non-Elemental Acceptor and Donor Centers in Ultra-Pure GermaniumIEEE Transactions on Nuclear Science, 1978
- Electronic Raman scattering from valley-orbit transitions in uniaxially stressed Ge(As)Physical Review B, 1977
- Chemical Impurities and Lattice Defects in High-Purity GermaniumIEEE Transactions on Nuclear Science, 1974
- High resolution photoconductivity studies of residual shallow donors in ultrapure GeSolid State Communications, 1972
- Higher Donor Excited States for Prolate-Spheroid Conduction Bands: A Reevaluation of Silicon and GermaniumPhysical Review B, 1969
- Excitation Spectrum of Arsenic Impurity in Germanium under Uniaxial CompressionPhysical Review B, 1965
- Theory of Transport Effects in Semiconductors: ThermoelectricityPhysical Review B, 1956