X-ray topographic observation of polytype distributions in silicon carbide
- 1 November 1967
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 18 (11) , 1589-1659
- https://doi.org/10.1088/0508-3443/18/11/312
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Studies of Individual Dislocations in Crystals by X-Ray Diffraction MicroradiographyJournal of Applied Physics, 1959
- A method for the examination of crystal sections using penetrating characteristic X radiationActa Metallurgica, 1957