Investigation of the solar cell emitter quality by LBIC-like image techniques
- 1 February 2000
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 71 (1-3) , 238-243
- https://doi.org/10.1016/s0921-5107(99)00382-7
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- A new method for accurate measurements of the lumped series resistance of solar cellsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Application of Dynamical Optical Reflection Thermography (DORT) for detecting of dark current inhomogeneity in semiconductor devicesApplied Surface Science, 1999
- Activation energy of local currents in solar cells measured by thermal methodsProgress In Photovoltaics, 1998
- New technique for investigation of solar cell sheet resistance distribution by laser beam scanningPublished by SPIE-Intl Soc Optical Eng ,1998
- Local channel temperature measurements on pseudomorphic high electron mobility transistors by photoluminescence spectroscopyApplied Physics Letters, 1998
- Infrared characterization of hot spots in solar cells with high precision due to signal treatment processingSolar Energy Materials and Solar Cells, 1998
- Thermal mapping with liquid crystal methodMicroelectronic Engineering, 1996
- A surface temperature limit detector using nematic liquid crystals with an application to microcircuitsJournal of Physics E: Scientific Instruments, 1974