New Substrates for Polymer Cationization with Time-of-Flight Secondary Ion Mass Spectrometry
- 12 July 2000
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 16 (16) , 6503-6509
- https://doi.org/10.1021/la991436z
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- Improvement of signal intensities in static secondary-ion mass spectrometry using halide additives and substrate modificationJournal of Mass Spectrometry, 1998
- TOF-SIMS analysis of polymersNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1997
- Secondary Ion Mass Spectrometry of Polymers: a ToF SIMS Study of Monodispersed PMMA StandardsSurface and Interface Analysis, 1997
- Weak interactions between deposited metal overlayers and organic functional groups of self-assembled monolayersProgress in Surface Science, 1995
- Chemical derivatization and surface analysisApplied Surface Science, 1988
- Time-of-flight secondary ion mass spectrometry of nylons: detection of high mass fragmentsAnalytical Chemistry, 1985
- Redox properties of octacyano-substituted zinc phthalocyanine ((CN)8PcZn). New charge-transfer complexJournal of the American Chemical Society, 1983
- Combined XPS and SIMS study of amino acid overlayersSurface Science, 1979
- Detection, identification, and structural investigation of biologically important compounds by secondary ion mass spectrometryAnalytical Chemistry, 1978
- Cationization of organic molecules in secondary ion mass spectrometryJournal of the American Chemical Society, 1977