Elektronenmikroskopische Untersuchung zur Struktur aufgedampfter Nickel/Chrom‐Schichten
- 1 January 1970
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 5 (1) , 95-99
- https://doi.org/10.1002/crat.19700050107
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Phase analysis of amorphous resistive filmsBritish Journal of Applied Physics, 1966
- The effect of composition on the temperature coefficient of resistance of NiCr filmsBritish Journal of Applied Physics, 1965
- The structure of vacuum condensed Ni-Cr filmsMicroelectronics Reliability, 1964