REDUCED OXIDATION STATES AND RADIATION-INDUCED TRAP GENERATION AT Si/SiO2 INTERFACE
- 1 January 1980
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Electronic structure of Si:-quartz and the influence of local disorderPhysical Review B, 1980
- Local atomic and electronic structure of oxide/GaAs and SiO2/Si interfaces using high-resolution XPSJournal of Vacuum Science and Technology, 1979
- Spectroscopic evidence for valence-alternation-pair defect states in vitreous SiO2Philosophical Magazine Part B, 1979
- SiSiO2 interface characterization by ESCASurface Science, 1979
- Morphology and electronic structure of Si–SiO2 interfaces and Si surfacesJournal of Vacuum Science and Technology, 1979
- Colour centres in vitreous silicaPhilosophical Magazine Part B, 1978
- Silicon dioxide and the chalcogenide semiconductors; similarities and differencesAdvances in Physics, 1977
- Charge storage in SiO2 under low-energy electron bombardmentApplied Physics Letters, 1974