FI-STM investigation of the Si(111) 2 × 1 cleaved surface
- 31 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 915-921
- https://doi.org/10.1016/0304-3991(92)90378-w
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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