Comment on "Determination of Interface States for Ca $F_{2}$ /Si(111) from Near-Edge X-Ray-Absorption Measurements"

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11 January 1988

journal article
research article
Published by American Physical Society (APS) in Physical Review Letters

Vol. 60 (2) , 160
https://doi.org/10.1103/physrevlett.60.160

Abstract

DOI: https://doi.org/10.1103/PhysRevLett.60.160

Keywords

This publication has 2 references indexed in Scilit:

Electronic structure of the ${CaF}_{2}$ /Si(111) interface
Physical Review B, 1986
Determination of Interface States for Ca $F_{2}$ /Si(111) from Near-Edge X-Ray-Absorption Measurements
Physical Review Letters, 1986