Recent advances and applications of high resolution electron microscopy
- 1 November 1984
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 136 (2) , 127-135
- https://doi.org/10.1111/j.1365-2818.1984.tb00523.x
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Ion-beam damage in hollanditeJournal of Materials Science, 1983
- Substitutional Disorder in a Trirutile-type MgSb2O6 Crystal Studied by 1 MV High-Resolution Transmission Electron MicroscopyTransactions of the Japan Institute of Metals, 1983
- New Trend of Atom Resolution Electron Microscopy—Direct observations of atoms, vacancies and impurity atoms in crystal and on-line image analysis—Transactions of the Japan Institute of Metals, 1983
- The role of high-resolution electron microscopy in the development of solid state chemistryUltramicroscopy, 1982
- The nature and extent of disorder within rapidly cooled TiO 1.9985Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1982
- Atomic structure of the NiSi2/(111)Si interfacePhilosophical Magazine A, 1982
- High resolution electron microscopy of molecular crystals I. Quaterrylene, C 40 H 20Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1982
- Combined HREM and STEM microanalysis on decorated dislocation coresUltramicroscopy, 1982
- Structure determination of a mixed-layer bismuth titanate, Bi7Ti4NbO21, by super-high-resolution electron microscopyActa Crystallographica Section A, 1977
- The direct correlation between lattice fringes and atomic positions in defect structures in N-niobium oxidePhysica Status Solidi (a), 1972