Combined HREM and STEM microanalysis on decorated dislocation cores
- 1 January 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 9 (3) , 183-189
- https://doi.org/10.1016/0304-3991(82)90198-x
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Improved visualization of single- and double-stranded nucleic acids by STEMUltramicroscopy, 1981
- Applications of surface analysis techniques to photovoltaic research: Grain and grain boundary studiesApplications of Surface Science, 1981
- A study of the charging and dissociation of SiO2 Surfaces by AESSurface Science, 1977