Auger electron spectroscopy of compounds in the Si-Ti-C system: Characterization of Si-Ti-C multiphased materials obtained by CVD
- 20 April 1993
- journal article
- Published by Elsevier in Surface Science
- Vol. 286 (1-2) , 82-91
- https://doi.org/10.1016/0039-6028(93)90558-2
Abstract
No abstract availableKeywords
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