Effects of thickness on the characteristic length scale of dislocation plasticity in Ag thin films
- 1 October 2001
- journal article
- Published by Elsevier in Acta Materialia
- Vol. 49 (17) , 3597-3607
- https://doi.org/10.1016/s1359-6454(01)00225-7
Abstract
No abstract availableKeywords
This publication has 32 references indexed in Scilit:
- Diffusional creep in damascene Cu linesJournal of Applied Physics, 2001
- Activation volume for inelastic deformation in polycrystalline Ag thin filmsActa Materialia, 2000
- Investigation of defect ordering in heavily irradiated metals by high- voltage electron microscopyPhysica Status Solidi (a), 1989
- Plastic properties of thin films on substrates as measured by submicron indentation hardness and substrate curvature techniquesJournal of Materials Research, 1986
- Rate-dependent plastic flow in polycrystalline silver at ambient temperatureScripta Metallurgica, 1983
- Linewidth dependence of electromigration in evaporated Al-0.5%CuApplied Physics Letters, 1980
- Radiation-induced processes in experiments carried out in-situ in the high-voltage electron microscopePhysica Status Solidi (a), 1979
- An X-ray line profile analysis in vacuum-evaporated silver filmsJournal of Physics D: Applied Physics, 1975
- Observation of point‐defect cluster formation in copper during low‐temperature electron irradiationPhysica Status Solidi (b), 1975
- The Structure of Electroplated and Vapor-Deposited Copper FilmsJournal of Applied Physics, 1972