Preparation of Cross-Sectional TEM Samples of PbTe and CdxPb1−x Te on BaF2
- 1 January 1990
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Cross‐Section preparation for tem of film‐substrate combinations with a large difference in sputtering yieldsJournal of Electron Microscopy Technique, 1986
- Growth of single-crystal CoSi2 on Si(111)Applied Physics Letters, 1982
- Cross-sectional specimens for transmission electron microscopyJournal of Applied Physics, 1974