Electron Emission from Aluminum after Low-Temperature Deformation
- 1 November 1965
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (11) , 3549-3555
- https://doi.org/10.1063/1.1703038
Abstract
Emission of electrons (``exo‐electrons'') was observed by means of an open‐window Geiger—Müller counter during annealing of aluminum wire subsequent to low‐temperature deformation. A mathematical model was developed based on the concept that the emission is controlled by the diffusion of point defects to the surface. Interpretation of the experimental data yielded an activation energy of 0.44±0.03 eV for the migration of the point defects. Electrical resistivity measurements made at 4.2°K on aluminum deformed at a low temperature revealed that defects anneal out in the general temperature range in which emission is observed.This publication has 21 references indexed in Scilit:
- Quenching and Annealing of Zone-Refined AluminumPhysical Review B, 1964
- Recovery Study in Pure and Alloyed Aluminum Following Electron IrradiationPhysical Review B, 1963
- Kinetics of Vacancy Motion in High-Purity AluminumPhysical Review B, 1959
- A possible determination of the activation energy for self-diffusion in aluminiumPhilosophical Magazine, 1959
- Isochronal annealing of vacancies in aluminiumPhilosophical Magazine, 1958
- A survey of exo-electron emission phenomenaBritish Journal of Applied Physics, 1958
- Quenching vacancies in aluminiumPhilosophical Magazine, 1957
- Die Elektronenemission bei der plastischen Verformung von ZinkkristallenThe European Physical Journal A, 1956
- A study of the structure of abraded metal surfacesProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1955
- Die verzögerte Elektronenemission von MetallenThe European Physical Journal A, 1955