Nonlinear 1/fnoise in amorphous silicon
- 28 October 1991
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 67 (18) , 2529-2532
- https://doi.org/10.1103/physrevlett.67.2529
Abstract
Measurements of coplanar current fluctuations in n-type hydrogenated amorphous silicon (a-Si:H) find that the spectral density of the noise accurately obeys a 1/f frequency dependence for frequency f in the range 1<f< Hz over a temperature range 300≤T≤450 K. The noise power density displays a power-law dependence on the dc current, where the power-law exponent b increases with temperature from b∼1 at 350 K to ∼2.5 at 450 K. These results are discussed in terms of models for noise in composite and inhomogeneous materials.
Keywords
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