SNR improvement in silica-based waveguide Rayleighbackscatteringmeasurement using a complex optical low coherence reflectometer
- 25 April 1996
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 32 (9) , 843-845
- https://doi.org/10.1049/el:19960572
Abstract
The authors report a signal-to-noise ratio (SNR) improvement in the Rayleigh backscattering measurement of a silica-based waveguide over 20 cm, achieved by constructing a complex optical low coherence reflectometer with an auxiliary interferometer. The best SNR achieved is 38, which corresponds to signal fluctuations of ±0.1 dB, and the spatial resolution is 1.3 cm. The measured Rayleigh backscattering distribution clearly revealed the waveguide loss.Keywords
This publication has 2 references indexed in Scilit:
- Loss distribution measurement of silica-based waveguidesby using a jaggedness-free optical low coherence reflectometerElectronics Letters, 1994
- Complex coherence-domain reflectometry in active laser diodesOptics Letters, 1992