Impact of the gate-to-body tunneling current on SOI history effect

Publisher Website

8 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/soi.2000.892800

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Submicron transferred-substrate heterojunction bipolar transistors
IEEE Electron Device Letters, 1999