Observations on the effects of fault manifestation as a function of workload
- 1 May 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. 41 (5) , 559-566
- https://doi.org/10.1109/12.142682
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- DEPENDABLE COMPUTING AND FAULT TOLERANCE : CONCEPTS AND TERMINOLOGYPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Evaluation of error detection schemes using fault injection by heavy-ion radiationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Transient fault behavior in a microprocessor-A case studyPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Analysis of workload influence on dependabilityPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A Fault Behavior Model for an Avionic Microprocessor: A Case StudyPublished by Springer Nature ,1991
- Processor Control Flow Monitoring Using Signatured Instruction StreamsIEEE Transactions on Computers, 1987
- Measurement and modeling of computer reliability as affected by system activityACM Transactions on Computer Systems, 1986
- Logic Testing and Design for TestabilityPublished by MIT Press ,1985
- Test Generation for MicroprocessorsIEEE Transactions on Computers, 1980