Evaluation of error detection schemes using fault injection by heavy-ion radiation
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- 7 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 340-347
- https://doi.org/10.1109/ftcs.1989.105590
Abstract
Several concurrent error detection schemes suitable for a watch-dog processor were evaluated by fault injection. Soft errors were induced into a MC6809E microprocessor by heavy-ion radiation from a Californium-252 source. Recordings of error behavior were used to characterize the errors as well as to determine coverage and latency for the various error detection schemes. The error recordings were used as input to programs that simulate the error detection schemes. The schemes evaluated detected up to 79% of all errors within 85 bus cycles. Fifty-eight percent of the errors caused execution to diverge permanently from the correct program. The best schemes detected 99% of these errors. Eighteen percent of the errors affected only data, and the coverage of these errors was at most 38%.Keywords
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