Trends in Parts Susceptibility to Single Event Upset from Heavy Ions
- 1 January 1985
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 32 (6) , 4189-4194
- https://doi.org/10.1109/TNS.1985.4334092
Abstract
New test data from the Jet Propulsion Laboratory (JPL), The Aerospace Corporation, Rockwell International (Anaheim) and IRT have been combined with published data of JPL [1,2] and Aerospace [3] to form a nearly comprehensive body of single event upset (SEU) test data for heavy ion irradiations. This data has been arranged to exhibit the SEU susceptibility of devices by function, technology and manufacturer. Clear trends emerge which should be useful in predicting future device performance.Keywords
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