De-correlation Effects in Speckle-pattern Interferometry
- 1 May 1977
- journal article
- research article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 24 (5) , 533-550
- https://doi.org/10.1080/716099421
Abstract
A theoretical analysis of de-correlation effects in plane strain sensitive speckle-pattern interferometry is presented. Experimental results supporting the theoretical model are summarized and it is shown that in-plane translations and out-of-plane rotations typically of order 102 μm and 10-3 radians respectively may be tolerated before fringe visibility becomes unacceptable. The results also indicate how the interferometer may be optimized. Interferograms which show the strain fields resulting from machining are presented.Keywords
This publication has 4 references indexed in Scilit:
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- A white light projection technique for viewing double-exposure speckle interferogramsJournal of Physics E: Scientific Instruments, 1974
- Holographic and Video Techniques Applied to Engineering MeasurementMeasurement and Control, 1971
- Recording of In-plane Surface Displacement by Double-exposure Speckle PhotographyOptica Acta: International Journal of Optics, 1970