A white light projection technique for viewing double-exposure speckle interferograms
- 1 August 1974
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 7 (8) , 616
- https://doi.org/10.1088/0022-3735/7/8/010
Abstract
A method is described of viewing double-exposure speckle pattern interference fringes using a simple white light projection arrangement. A typical experimental result is presented.Keywords
This publication has 2 references indexed in Scilit:
- Elastic constant and strain measurements using a three beam speckle pattern interferometerJournal of Physics E: Scientific Instruments, 1974
- A double exposure technique for speckle pattern interferometryJournal of Physics E: Scientific Instruments, 1971