Direct infrared measurements of filament transient temperature during switching in vanadium oxide film devices
- 15 January 1975
- journal article
- Published by Elsevier in Journal of Solid State Chemistry
- Vol. 12 (3-4) , 303-306
- https://doi.org/10.1016/0022-4596(75)90330-8
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Role of Capacitive Discharge Energy in the Switching of Semiconducting GlassesPhysical Review Letters, 1971
- Thermal filaments in vanadium dioxideIEEE Transactions on Electron Devices, 1969