Mapping of the local minority carrier diffusion length in silicon wafers
- 1 January 1993
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 63 (1-4) , 213-217
- https://doi.org/10.1016/0169-4332(93)90092-p
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
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- Charge collection scanning electron microscopyJournal of Applied Physics, 1982