Detection limits in elemental distribution images produced by energy filtering TEM: case study of grain boundaries in Si3N4
- 31 July 1994
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 55 (1) , 101-112
- https://doi.org/10.1016/0304-3991(94)90084-1
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Statistical Analysis of the Intergranular Film Thickness in Silicon Nitride CeramicsJournal of the American Ceramic Society, 1993
- Quantitative Comparison of TEM Techniques for Determining Amorphous Intergranular Film ThicknessJournal of the American Ceramic Society, 1993
- Performance of a low-noise CCD camera adapted to a transmission electron microscopeUltramicroscopy, 1992
- Elemental mapping using an imaging energy filter: image formation and resolution limitsMicroscopy Microanalysis Microstructures, 1992
- Performance of electron image converters with YAG single-crystal screen and CCD sensorUltramicroscopy, 1991
- Quantitative analysis of electron-energy-loss spectraUltramicroscopy, 1989
- On the Equilibrium Thickness of Intergranular Glass Phases in Ceramic MaterialsJournal of the American Ceramic Society, 1987
- Theory of Image Formation by Inelastically Scattered Electrons in the Electron MicroscopePublished by Elsevier ,1985
- About the use of electron energy-loss spectroscopy for chemical mapping of thin foils with high spatial resolutionUltramicroscopy, 1978
- Inelastic scattering of 80 keV electrons in amorphous carbonPhilosophical Magazine, 1975