Measurement of the Extrinsic Series Elements of a Microwave Mesfet Under Zero Current Conditions

Publisher Website

1 October 1982

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/euma.1982.333103

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Determination of impurity and mobility distributions in epitaxial semiconducting films on insulating substrate by C-V and Q-V analysis
Applied Physics Letters, 1974
Microwave Properties of Schottky-barrier Field-effect Transistors
IBM Journal of Research and Development, 1970