Piezoelectric Characterization of Individual Zinc Oxide Nanobelt Probed by Piezoresponse Force Microscope
Top Cited Papers
- 28 February 2004
- journal article
- letter
- Published by American Chemical Society (ACS) in Nano Letters
- Vol. 4 (4) , 587-590
- https://doi.org/10.1021/nl035198a
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
- Fabrication and application potential of ZnO nanowires grown on GaAs(002) substrates by metal–organic chemical vapour depositionNanotechnology, 2003
- Spontaneous Polarization-Induced Nanohelixes, Nanosprings, and Nanorings of Piezoelectric NanobeltsNano Letters, 2003
- Nanoscale mechanical behavior of individual semiconducting nanobeltsApplied Physics Letters, 2003
- Piezoelectric Coefficient Measurements in Ferroelectric Single Crystals Using High Voltage Atomic Force MicroscopyNano Letters, 2003
- Field-Effect Transistors Based on Single Semiconducting Oxide NanobeltsThe Journal of Physical Chemistry B, 2002
- Characterization of sputtered ZnO thin film as sensor and actuator for diamond AFM probeSensors and Actuators A: Physical, 2002
- Nanobelts of Semiconducting OxidesScience, 2001
- Spontaneous polarization and piezoelectric constants of III-V nitridesPhysical Review B, 1997
- Logarithmic frequency dependence of the piezoelectric effect due to pinning of ferroelectric-ferroelastic domain wallsPhysical Review B, 1997
- Measurement of the piezoelectricity of films with scanning tunneling microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1995