Magnetic and microwave resonance characterization of ion beam sputtered amorphous Fe/sub x/Ni/sub 80-x/B/sub 15/Si/sub 5/ films
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 25 (5) , 3355-3357
- https://doi.org/10.1109/20.42299
Abstract
No abstract availableKeywords
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