Instrumentation and Operation for High-Resolution Electron Microscopy

This publication has 60 references indexed in Scilit:

• High-resolution studies of order and disorder in alloys
  Ultramicroscopy, 1985
• A 400 kV High Resolution-Analytical Electron Microscope Newly Constructed
  Japanese Journal of Applied Physics, 1984
• A versatile test rig for the evaluation of thermionic electron guns
  Journal of Physics E: Scientific Instruments, 1982
• Scanning transmission electron microscopy: microanalysis for the microelectronic age
  Journal of Physics F: Metal Physics, 1981
• Electron-optical imaging of Ti₆O₁₁at 1·6 Å point-to-point resolution
  Philosophical Magazine A, 1978
• Factors affecting high resolution fixed-beam transmission electron microscopy
  Ultramicroscopy, 1976
• Measurement of focus and spherical aberration of an electron microscope objective lens
  Ultramicroscopy, 1976
• Lanthanum Hexaboride Electron Emitter
  Journal of Applied Physics, 1972
• The lives of electron microscope filaments
  British Journal of Applied Physics, 1957
• Experimentelle Bestimmung der Energieverteilung in thermisch ausgelösten Elektronenstrahlen
  The European Physical Journal A, 1954