A study of Al/Si(111)-cleaved interface by photoemission, Auger electron yield, and Auger electron spectroscopies
- 31 August 1981
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 39 (7) , 851-855
- https://doi.org/10.1016/0038-1098(81)90530-5
Abstract
No abstract availableKeywords
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