Characterizing N-port packages and interconnections with a 2-port network analyzer

This publication has 4 references indexed in Scilit:

• Wideband 2N-port S-parameter extraction from N-port S-parameter data
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Techniques for Correcting Scattering Parameter Data of an Imperfectly Terminated Multiport When Measured with a Two-Port Network Analyzer
  IEEE Transactions on Microwave Theory and Techniques, 1983
• Comments on "A Rigorous Techique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer"
  IEEE Transactions on Microwave Theory and Techniques, 1983
• A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network Analyzer
  IEEE Transactions on Microwave Theory and Techniques, 1982