Wideband 2N-port S-parameter extraction from N-port S-parameter data

Publisher Website

24 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/epep.1996.564814

Abstract

No abstract available

Keywords

This publication has 1 reference indexed in Scilit:

Measurement of package inductance and capacitance matrices
IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part B, 1996